Atomic-Layer Etching System for Si-based Materials

Oxford Instruments, PlasmaPro 100 Cobra Modus Operandi: User-mode Contamination category: A, B Sample-size: Pieces … 6″ wafers FOM-Name: ALE for Si-based Materials (Oxford Instruments, PlasmaPro100) Location: CMNT, Room 007 Tool manager: Birger Berghoff Instruction video: Open video Tool description: Atomic-layer etching system for Si-based Materials. Available etching processes: Si, SiO2. Available gases: SF6, CH4, CHF3, O2, […]

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Stylus Profiler

Tencor, P-10 Modus Operandi:User-ModeContamination category:CSample-size:100 mm, 150 mm, 200mm Wafer FOM-Name:- Profiler Tencor P-10Location:ZMNT, Room 007 Tool manager: Jochen Heiss Instruction video: Not available Tool description: A computerized, highly sensitive surface profiler that measures roughness, waviness, step height, and other surface characteristics in a variety of applications.

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